On a Drift-diffusion System for Semiconductor Devices
نویسندگان
چکیده
In this note we study a fractional Poisson-Nernst-Planck equation modeling a semiconductor device. We prove several decay estimates for the Lebesgue and Sobolev norms in one, two and three dimensions. We also provide the first term of the asymptotic expansion as t → ∞.
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